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COURSE INFORMATION FOR CURRENT SEMESTER/TERM







           Teaching Schedule


                                                                                   References/Teaching Materials/
              Week                    Lecture/Tutorial/Assignment Topic
                                                                                            Equipment
                1       Introduction. Electron and molecular spectroscopy.         Lecture Notes and  Ref


                2
                        FTIR Spectroscopy                                          Lecture Notes and  Ref

                3
                        UV-Vis Spectroscopy                                        Lecture Notes and  Ref

                4       Thermal analysis techniques:  DSC, DTA, TGA etc
                                                                                   Lecture Notes and  Ref


                5       Thermal analysis techniques:  DSC, DTA, TGA etc
                                                                                   Lecture Notes and  Ref

                        X-ray  diffraction:  properties,  production  and  detection  of  x-ray  in  the
                6       context of diffraction technique                           Lecture Notes and  Ref

                7       X-ray  diffraction:  structure  factor  calculations.  Factors  governing  dif-
                        fracted intensity in powder method                         Lecture Notes and  Ref

                        X-ray  diffraction:  Application  of  X-ray  diffraction  in  typical  materials
                8
                        science and engineering problems e.g., phase identification, crystallite   Lecture Notes and  Ref
                        size measurement in nanomaterials, structural investigation etc
                9       Electron  beam-solid  interactions  and  principles  of  scanning  electron
                        microscopy (SEM)                                           Lecture Notes and  Ref

                        SEM: image formation and operation of SEM, resolution and depth of
               10       field, generation of secondary and backscattered signals, contrast etc.   Lecture Notes and  Ref


               11       Micro analysis: principles. Energy dispersive and wave length disper-
                        sive x-ray spectroscopy. Quantitative analysis and ZAF correction.   Lecture Notes and  Ref

                        Transmission  electron  microscopy  (TEM):  Principles  of  image  for-
               12       mation in a TEM. Contrast mechanisms: mass-thickness contrast and
                        diffraction contrast.                                      Lecture Notes and  Ref

               13       TEM: Electron diffraction. Spot patterns, analysis of single crystal and
                        polycrystalline patterns. Micro/nano analysis in TEM.      Lecture Notes and  Ref

                        TEM: Electron diffraction. Spot patterns, analysis of single crystal and
               14       polycrystalline patterns. Micro/nano analysis in TEM.      Lecture Notes and  Ref




          UM—PT01-PK03-BR004(BI)-S04
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