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Faculty of Science Handbook, Session 2017/2018




               Medium of Instruction:                           Soft-skills:
               English                                          CS2, CT3, LL2
               Soft-skills:                                     References:
               CS2, CT3, LL2                                    1.  J.P. Holman, Experimental Methods for Engineers (McGraw-Hill,
                                                                   2001)
               References:                                      2.  J.R. Taylor, An Introduction to Error Analysis (University Science,
               1. S.J. Blundell & K.M. Blundell, Concepts in Thermal Physics, 2nd ed.  1997)
                 (Oxford, 2009)                                 3.  N.C.  Barford,  Experimental  Measurements:  Precision,  Error  and
               2. F.W.  Sears  &  G.L.  Salinger,  Thermo-dynamics,  Kinetic  Theory  &  Truth (Wiley, 1991)
                 Statistical Thermodynamics, 3 Ed. (Addison-Wesley, 1975)  4.  J.  Topping,  Errors  of  Observation  and  their  Treatment,  3rd  ed.
                                   rd
               3. Daniel V. Schroeder, An Introduction to Thermal Physics (Addison  (IOP&PS, 1990)
                 Wesley Longman, 2000)
               4. Mark  W.  Zemansky  &  Richard  H.  Dittman,  Heat  and
                 Thermodynamics, 7 Ed. (McGraw-Hill Int’l Ed., 1997)  SMES1271  PRACTICAL PHYSICS
                             th
               5. Thomas  Espinola,  Introduction  to  Thermophysics  (Wm.C.  Brown
                 Publ., 1994)                                   Physics  experiments  on  the  topics  of  mechanics,  heat,  electricity,
                                                                magnetism, optics and modern physics. Simple computer programming
               SMES1204  BASIC ELECTRONICS
                                                                Assessment Method:
               Circuit Theory: Kirchhoff’s law, Thevenin’s theorem, Norton’s theorem,  Continuous Assessment:  100%
               Ohm’s law, circuit analysis technique, impedance matching.
               Semiconductor  Diodes:  Properties of  semiconductor,  pn  junction,  Medium of Instruction:
               forward and reverse bias conditions, basic energy band diagrams, the  English
               current-voltage  characteristics  and  simple  diode  circuits;  the  use  of
               diodes in power supply circuits: half-wave, full-wave, bridge rectifiers;  Soft-skills:
               transformer,  capacitor-input  and  choke-input  filters,  special  diodes –  CS3, CT3, TS1, LL2
               Zener diode, voltage regulators.
               Bipolar junction Transistor (BJT): Characteristics of transistor, simple  References:
               transistor circuit, current and voltage gain, load line concept, biasing  Laboratory manual
               requirements and D.C analysis of the circuits.
               Field  Effect  Transistor  (JFET  and  MOSFET):  Constructions  and
               structures of JFET and MOSFET, principle of operation, current-voltage  SMEB1201 INTRODUCTION TO MATERIALS SCIENCE
               characteristics, biasing requirements and D.C. analysis.
                                                                Atom,  molecule,  bonding  and  bonding  forces;  crystal  structure,  non-
               Assessment Method:                               crystalline, microstructure; solidification; imperfections in solids, kinetics
                Final Examination:     60%                      and phase diagrams, diffusion.
                Continuous Assessment:  40%                     Metals and alloys, ceramics and glasses, polymers and their derivatives,
                                                                composites.
               Medium of Instruction:                           Mechanical,  thermal,  electrical,  magnetic  and  electronics  properties.
               English                                          Static and dynamics tests, stress, strain, tensile, shear, creep, fatigue,
                                                                failure analysis.
               Soft-skills:
               CS2, CT3, TS1, LL2                               Assessment Method:
                                                                 Final Examination:     60%
               References:                                       Continuous Assessment:  40%
               1.  R.  Boylestad  &  L.  Nashelsky,  Electronic  Devices  and  Circuit
                  Theory, 10th ed. (Prentice Hall, 2008)        Medium of Instruction:
               2.  T.L.  Floyd  &  D.  Buchla, Electronics  Fundamentals:  Circuits,  English
                  Devices, and Applications, 8th ed. (Prentice Hall, 2009)
               3.  A.P. Malvino & D. Bates, Electronic Principles with simulation CD  Soft-skills:
                  (Career Education, 2006)                      CS3, CT3, LL2
               4.  A.J.  Diefenderfer  &  B.E.  Holton,  Principles  of  Electronic
                  Instrumentation, 3 Edition (Saunders Coll. Publ., 1994)  References:
                             rd
                                                                1.  William  D.  Callister,  Materials  Science  and  Engineering  :  An
                                                                   Introduction, 6 Ed. (Wiley, 2002)
                                                                           th
               SMES1205  EXPERIMENTAL METHODS                   2.  Zbigniew D. Jastrzbeski, The Nature and Properties of Engineering
                                                                   Materials, 3 Ed. (Wiley,1987)
                                                                          rd
               Experiment: Function and design. Quantitative Physics, dimensional  3.  William F. Smith, Principles of Materials Science and Engineering,
               analysis.                                           3 Ed. (McGraw-Hill, 1996)
                                                                    rd
               Basic  measurements:  callipers,  electric  meters,  oscilloscopes.
               Experimental  data  analysis:  precision  and  accuracy,  significant
               figures, systematic error, statistical error, propagation of uncertainties of  SMEB1202 MODERN PHYSICS FOR MATERIALS SCIENCE
               measurement,  uncertainty  analysis,  statistical  analysis,  data  fitness,
               confidence limit, test for bias, calibration. Treatment and reduction data.  Quantum Theory: The need for quantum theory; duality of particle-
               Data presentation: Tables and graphs. Reporting writing, Laboratory  wave;  wave  function;  Heisenberg  uncertainty,  Time  independent
               safety.4                                         Schrodinger equation; examples in 1-D, Infinitely square potential well,
                                                                etc. Derivation of Second Newton Law from quantum mechanics.
               Assessment Method:                               Atomic matter: summary of atomic structure and periodic table; types
                Final Examination:     60%                      of atomic bonding, Van de Waals bond, Lennard Jones potential and its
                Continuous Assessment:  40%                     relation to mass characteristics; crystal structures, summary of phonon
                                                                concepts. Summary of electron conduction in conductor, semiconductor
               Medium of Instruction:                           and insulator.
               English                                          Nuclear Physics and Radioactivity: Structure and characteristics of
                                                                nucleus, binding energy, nuclear forces; radioactivity, conservation laws,
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