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Faculty of Science Handbook, Session 2017/2018
Medium of Instruction: Soft-skills:
English CS2, CT3, LL2
Soft-skills: References:
CS2, CT3, LL2 1. J.P. Holman, Experimental Methods for Engineers (McGraw-Hill,
2001)
References: 2. J.R. Taylor, An Introduction to Error Analysis (University Science,
1. S.J. Blundell & K.M. Blundell, Concepts in Thermal Physics, 2nd ed. 1997)
(Oxford, 2009) 3. N.C. Barford, Experimental Measurements: Precision, Error and
2. F.W. Sears & G.L. Salinger, Thermo-dynamics, Kinetic Theory & Truth (Wiley, 1991)
Statistical Thermodynamics, 3 Ed. (Addison-Wesley, 1975) 4. J. Topping, Errors of Observation and their Treatment, 3rd ed.
rd
3. Daniel V. Schroeder, An Introduction to Thermal Physics (Addison (IOP&PS, 1990)
Wesley Longman, 2000)
4. Mark W. Zemansky & Richard H. Dittman, Heat and
Thermodynamics, 7 Ed. (McGraw-Hill Int’l Ed., 1997) SMES1271 PRACTICAL PHYSICS
th
5. Thomas Espinola, Introduction to Thermophysics (Wm.C. Brown
Publ., 1994) Physics experiments on the topics of mechanics, heat, electricity,
magnetism, optics and modern physics. Simple computer programming
SMES1204 BASIC ELECTRONICS
Assessment Method:
Circuit Theory: Kirchhoff’s law, Thevenin’s theorem, Norton’s theorem, Continuous Assessment: 100%
Ohm’s law, circuit analysis technique, impedance matching.
Semiconductor Diodes: Properties of semiconductor, pn junction, Medium of Instruction:
forward and reverse bias conditions, basic energy band diagrams, the English
current-voltage characteristics and simple diode circuits; the use of
diodes in power supply circuits: half-wave, full-wave, bridge rectifiers; Soft-skills:
transformer, capacitor-input and choke-input filters, special diodes – CS3, CT3, TS1, LL2
Zener diode, voltage regulators.
Bipolar junction Transistor (BJT): Characteristics of transistor, simple References:
transistor circuit, current and voltage gain, load line concept, biasing Laboratory manual
requirements and D.C analysis of the circuits.
Field Effect Transistor (JFET and MOSFET): Constructions and
structures of JFET and MOSFET, principle of operation, current-voltage SMEB1201 INTRODUCTION TO MATERIALS SCIENCE
characteristics, biasing requirements and D.C. analysis.
Atom, molecule, bonding and bonding forces; crystal structure, non-
Assessment Method: crystalline, microstructure; solidification; imperfections in solids, kinetics
Final Examination: 60% and phase diagrams, diffusion.
Continuous Assessment: 40% Metals and alloys, ceramics and glasses, polymers and their derivatives,
composites.
Medium of Instruction: Mechanical, thermal, electrical, magnetic and electronics properties.
English Static and dynamics tests, stress, strain, tensile, shear, creep, fatigue,
failure analysis.
Soft-skills:
CS2, CT3, TS1, LL2 Assessment Method:
Final Examination: 60%
References: Continuous Assessment: 40%
1. R. Boylestad & L. Nashelsky, Electronic Devices and Circuit
Theory, 10th ed. (Prentice Hall, 2008) Medium of Instruction:
2. T.L. Floyd & D. Buchla, Electronics Fundamentals: Circuits, English
Devices, and Applications, 8th ed. (Prentice Hall, 2009)
3. A.P. Malvino & D. Bates, Electronic Principles with simulation CD Soft-skills:
(Career Education, 2006) CS3, CT3, LL2
4. A.J. Diefenderfer & B.E. Holton, Principles of Electronic
Instrumentation, 3 Edition (Saunders Coll. Publ., 1994) References:
rd
1. William D. Callister, Materials Science and Engineering : An
Introduction, 6 Ed. (Wiley, 2002)
th
SMES1205 EXPERIMENTAL METHODS 2. Zbigniew D. Jastrzbeski, The Nature and Properties of Engineering
Materials, 3 Ed. (Wiley,1987)
rd
Experiment: Function and design. Quantitative Physics, dimensional 3. William F. Smith, Principles of Materials Science and Engineering,
analysis. 3 Ed. (McGraw-Hill, 1996)
rd
Basic measurements: callipers, electric meters, oscilloscopes.
Experimental data analysis: precision and accuracy, significant
figures, systematic error, statistical error, propagation of uncertainties of SMEB1202 MODERN PHYSICS FOR MATERIALS SCIENCE
measurement, uncertainty analysis, statistical analysis, data fitness,
confidence limit, test for bias, calibration. Treatment and reduction data. Quantum Theory: The need for quantum theory; duality of particle-
Data presentation: Tables and graphs. Reporting writing, Laboratory wave; wave function; Heisenberg uncertainty, Time independent
safety.4 Schrodinger equation; examples in 1-D, Infinitely square potential well,
etc. Derivation of Second Newton Law from quantum mechanics.
Assessment Method: Atomic matter: summary of atomic structure and periodic table; types
Final Examination: 60% of atomic bonding, Van de Waals bond, Lennard Jones potential and its
Continuous Assessment: 40% relation to mass characteristics; crystal structures, summary of phonon
concepts. Summary of electron conduction in conductor, semiconductor
Medium of Instruction: and insulator.
English Nuclear Physics and Radioactivity: Structure and characteristics of
nucleus, binding energy, nuclear forces; radioactivity, conservation laws,
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