Page 240 - buku panduan 20192020

Faculty of Science Handbook, Session 2019/2020

Assessment Method:
Final Examination: 60% References:
Continuous Assessment: 40% 1. R. Boylestad & L. Nashelsky, Electronic Devices and Circuit
Theory, 10th ed. (Prentice Hall, 2008)
Medium of Instruction: 2. T.L. Floyd & D. Buchla, Electronics Fundamentals: Circuits,
English Devices, and Applications, 8th ed. (Prentice Hall, 2009)
3. A.P. Malvino & D. Bates, Electronic Principles with simulation CD
Soft-skills: (Career Education, 2006)
CS2, CT3, LL2 4. A.J. Diefenderfer & B.E. Holton, Principles of Electronic
Instrumentation, 3 Edition (Saunders Coll. Publ., 1994)
rd
References:
1. H.J. Pain, The Physics of Vibrations & Waves, 6 ed. (Wiley,
th
Chichester, 2005)
2. G.C. King, Vibrations and Waves (Wiley, 2009)
3. W. Gough, Vibrations and Waves, 2nd ed. (Prentice Hall, 1996)
4. I.G. Main, Vibrations and Waves in Physics, 3rd ed. (Cambridge SMES1205 EXPERIMENTAL METHODS
Univ. Press, 1993)
Experiment: Function and design. Quantitative Physics, dimensional
SMES1202 THERMAL PHYSICS analysis.
Basic measurements: callipers, electric meters, oscilloscopes.
Temperature, heat conduction, diffusion. Radiation, Stefan’s law, Zeroth Experimental data analysis: precision and accuracy, significant
law of thermodynamics, work and heat; First, Second and third laws of figures, systematic error, statistical error, propagation of uncertainties of
thermodynamics; entropy; phase transition, phase diagrams; kinetic measurement, uncertainty analysis, statistical analysis, data fitness,
theory for ideal gas, Maxwell-Boltzmann distribution; real gas. confidence limit, test for bias, calibration. Treatment and reduction data.
Introduction to statistical mechanics: microstates, equipartition of Data presentation: Tables and graphs. Reporting writing, Laboratory
energy, partition function, basic statistics for thermodynamics; statistical safety.4
entropy and information as negative entropy.
Assessment Method:
Assessment Method: Final Examination: 60%
Final Examination: 60% Continuous Assessment: 40%
Continuous Assessment: 40%
Medium of Instruction:
Medium of Instruction: English
English
Soft-skills:
Soft-skills: CS2, CT3, LL2
CS2, CT3, LL2
References:
References: 1. J.P. Holman, Experimental Methods for Engineers (McGraw-Hill,
1. S.J. Blundell & K.M. Blundell, Concepts in Thermal Physics, 2nd ed. 2001)
(Oxford, 2009) 2. J.R. Taylor, An Introduction to Error Analysis (University Science,
2. F.W. Sears & G.L. Salinger, Thermo-dynamics, Kinetic Theory & 1997)
Statistical Thermodynamics, 3 Ed. (Addison-Wesley, 1975) 3. N.C. Barford, Experimental Measurements: Precision, Error and
rd
3. Daniel V. Schroeder, An Introduction to Thermal Physics (Addison Truth (Wiley, 1991)
Wesley Longman, 2000) 4. J. Topping, Errors of Observation and their Treatment, 3rd ed.
4. Mark W. Zemansky & Richard H. Dittman, Heat and (IOP&PS, 1990)
Thermodynamics, 7 Ed. (McGraw-Hill Int’l Ed., 1997)
th
5. Thomas Espinola, Introduction to Thermophysics (Wm.C. Brown
Publ., 1994) SMES1271 PRACTICAL PHYSICS

SMES1204 BASIC ELECTRONICS Physics experiments on the topics of mechanics, heat, electricity,
magnetism, optics and modern physics. Simple computer programming
Circuit Theory: Kirchhoff’s law, Thevenin’s theorem, Norton’s theorem,
Ohm’s law, circuit analysis technique, impedance matching. Assessment Method:
Semiconductor Diodes: Properties of semiconductor, pn junction, Continuous Assessment: 100%
forward and reverse bias conditions, basic energy band diagrams, the
current-voltage characteristics and simple diode circuits; the use of Medium of Instruction:
diodes in power supply circuits: half-wave, full-wave, bridge rectifiers; English
transformer, capacitor-input and choke-input filters, special diodes –
Zener diode, voltage regulators. Soft-skills:
Bipolar junction Transistor (BJT): Characteristics of transistor, simple CS3, CT3, TS1, LL2
transistor circuit, current and voltage gain, load line concept, biasing
requirements and D.C analysis of the circuits. References:
Field Effect Transistor (JFET and MOSFET): Constructions and Laboratory manual
structures of JFET and MOSFET, principle of operation, current-voltage
characteristics, biasing requirements and D.C. analysis.
SMEB1201 INTRODUCTION TO MATERIALS SCIENCE
Assessment Method:
Final Examination: 60% Atom, molecule, bonding and bonding forces; crystal structure, non-
Continuous Assessment: 40% crystalline, microstructure; solidification; imperfections in solids, kinetics
and phase diagrams, diffusion.
Medium of Instruction: Metals and alloys, ceramics and glasses, polymers and their derivatives,
English composites.
Mechanical, thermal, electrical, magnetic and electronics properties.
Soft-skills: Static and dynamics tests, stress, strain, tensile, shear, creep, fatigue,
CS2, CT3, TS1, LL2 failure analysis.

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